Product | Single Crystal Silicon Wafer | |
Stock No | NS6130-10-1089 | |
CAS | 7440-21-3 | |
Diameter | 200mm ± 0.2mm | |
Doping | Undoped | |
Orientation | <100> ± 0.5° | |
Growth Method | FZ | |
Notch Orientation | <110> ± 1.0° | |
Center Thickness | 300µm – 500 µm | |
Surface | Double side polished | |
Micro Roughness | ≤18A | |
Laser Marking | None | |
Standard Tolerance | ±0.5° | |
Resistivity | >10000Ω/cm | |
Bow | 30µm | |
Edge Profile | Rounded | |
Quality Control | Each Lot of was tested successfully | |
Main Inspect Verifier | Manager QC |